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A semi-phenomenological model of the dependence of the total integrated intensity of dynamical diffraction on the ultrasonic amplitude was proposed and X-ray acoustic diagnostics of the characteristics of microdefects in single crystals was performed using it. It is shown that tthe dependences of the coherent and diffuse components of the total integrated intensity of dynamical diffraction on the ultrasonic amplitude can be significantly different.

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Diagnostics of Nanoscale Defects in Single Crystals by X-Ray Acoustic Method

  • 会议论文

  • 发表日期：

    2025年

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  • V. B. Molodkin,
  • G. I. Nizkova,
  • T. P. Vladimirova,
  • Y. V. Vasylyk,
  • A. O. Bilotska,
  • I. I. Demchik,
  • L. I. Makarenko,
  • S. V. Lizunova,
  • V. V. Molodkin,
  • I. M. Zabolotnyy,
  • V. V. Lizunov

摘要

A semi-phenomenological model of the dependence of the total integrated intensity of dynamical diffraction on the ultrasonic amplitude was proposed and X-ray acoustic diagnostics of the characteristics of microdefects in single crystals was performed using it. It is shown that tthe dependences of the coherent and diffuse components of the total integrated intensity of dynamical diffraction on the ultrasonic amplitude can be significantly different.