Synchrotron X-ray fluorescence imaging (SXRFI) is an advanced analytical technique that enables high-resolution, non-destructive imaging of element distribution in various materials. Recent advancements in SXRFI have significantly enhanced its capabilities, including improved spatial resolution through nanofocused beams, increased sensitivity for detecting trace elements, and the integration of multimodal imaging approaches. The application of machine learning and artificial intelligence in data processing is revolutionizing the analysis of SXRFI data, facilitating high-throughput studies and the extraction of quantitative information from complex datasets. This chapter provides an overview of the principles of SXRFI, its applications, and recent technological developments shaping its future in scientific research. After a short introduction to synchrotron radiation, facilities, and X-ray fluorescence techniques, the main principles and breakthroughs in the development of SXRFI are presented with some case studies from environmental research, biology, medicine and cultural heritage. An overview of the world's synchrotron beamlines offering SXRFI and Synchrotron X-ray fluorescence computer tomography (SXFCT) in 2024 is also provided to make it easier for users to choose the beamline that best suits their needs.