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Nanodosimetry aims to measure the ionizing radiation dose absorbed in nanosized volumes. For that, photothermostimulated exoelectron emission (PTSE) of monocrystalline silicon (Si) nanolayer might be used to detect weak electrons, because their mean free path in the solid is around 100 nm. The current work aims to explore the possibility of using monocrystalline Si for nanodosimetry of high energy electron radiation. It is demonstrated that the PTSE of monocrystalline Si can be used for the identification of 6 MeV electron radiation doses 35–60 Gy. The total emitted charge of PTSE is connected with the delivered dose. The near-threshold photoelectric emission spectroscopy and Fourier-transform infrared spectroscopy (FTIR) indicate that PTSE is influenced by radiation-induced reconstructions.

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Nanolayer of Monocrystalline Si Towards Nanodosimetry of Electron Radiation

  • 会议论文

  • 发表日期：

    2025年

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  • Gaļina Boka,
  • Yuri Dekhtyar,
  • Mirko Rocca,
  • Elizabete Skrebele,
  • Hermanis Sorokins

摘要

Nanodosimetry aims to measure the ionizing radiation dose absorbed in nanosized volumes. For that, photothermostimulated exoelectron emission (PTSE) of monocrystalline silicon (Si) nanolayer might be used to detect weak electrons, because their mean free path in the solid is around 100 nm. The current work aims to explore the possibility of using monocrystalline Si for nanodosimetry of high energy electron radiation. It is demonstrated that the PTSE of monocrystalline Si can be used for the identification of 6 MeV electron radiation doses 35–60 Gy. The total emitted charge of PTSE is connected with the delivered dose. The near-threshold photoelectric emission spectroscopy and Fourier-transform infrared spectroscopy (FTIR) indicate that PTSE is influenced by radiation-induced reconstructions.