Fault injection analysis is emerging as a key industrial requirement for integrated circuit (IC) security resiliency evaluation. Electromagnetic fault injection, or EMFI, has been one of the promising localized fault injection methods. Several empirical studies show the EMFI effectiveness on security critical assets, while maintaining low attack complexity/cost. Understanding IC impact by electromagnetic (EM) signal is a key factor towards a successful analysis, however extremely limited feasibility study has been produced in this regard. In this paper, we perform a feasibility study on EM field interaction and propagation on IC physical layer, i.e., transistor, wire model etc. The objective of the study is producing an abstracted EMFI model to understand the implications of various physical models impacted by EMFI, to review the field regions and their implications on the fault injection analysis. This study will provide a baseline for developing EMFI attack model or designing countermeasures.