Using Scanning Electron Microscopy to Identify Special-Purpose Structures by Their Fragments
摘要
This chapter is concerned with a comparative analysis of the existing approaches to identifying special-purpose structures, and estimates the advantages and limitations of each of them. The tasks to be solved in the identification of special-purpose structures (means of destruction) are established. It is accepted in the current practice to distinguish three classes of tasks addressed in the identification of special-purpose structures: identifying, classifying, and diagnostic ones. Characteristics of each class of tasks are described.