Exenteration Errors Combined with Wavefront Aberration
摘要
The basic concept of a Coherent Scanning Microscope (C.S.M.) was given by Minsky (U.S. Patent 3,013,467, Micros. Apparatus Dec. 19) in his patent application, while Davidovits et al. (Nature 223:831, 1969) built this microscope using direct laser illumination.