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We present a Contrast Source Inversion Method (CSI) that aims to reconstruct properties of an object located in a known background medium. In the context of magnetic resonance electrical properties tomography (MR-EPT), we use the finite element based CSI method for the reconstruction of the Electrical Properties (EPs) of the human brain tissues from synthetic measurements of the radio frequency field performed by Magnetic Resonance Imaging (MRI) scanners.

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A Contrast Source Inversion Method For Electrical Properties Reconstruction From Synthetic MRI Data

  • 会议论文

  • 发表日期：

    2025年

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  • Stephanie Lohrengel,
  • Charlotte Milano,
  • Stéphanie Salmon

摘要

We present a Contrast Source Inversion Method (CSI) that aims to reconstruct properties of an object located in a known background medium. In the context of magnetic resonance electrical properties tomography (MR-EPT), we use the finite element based CSI method for the reconstruction of the Electrical Properties (EPs) of the human brain tissues from synthetic measurements of the radio frequency field performed by Magnetic Resonance Imaging (MRI) scanners.