Metrology Training for EE/CE Students
摘要
This paper proposes a microelectronics metrology certificate program for undergraduate electrical and computer engineering students at Northern Arizona University, and a metrology training for non-traditional students and medical device manufacturers. The paper argues that metrology is crucial for the semiconductor industry, especially as the feature sizes shrink and the quality standards become more stringent. Solving the seven grand challenges proposed by NIST in metrology research and development requires a skilled workforce and academic innovation. The paper outlines the curriculum plan and implementation strategy for the proposed metrology certificate program, which consists of seven courses covering various metrology topics and techniques. The paper discusses how to build a metrology workforce pipeline through micro-credentials for high school CTE students and community college students, and upskilling training for medical device manufacturers. The paper concludes by highlighting the benefits of metrology training for both university students and medical device professionals, and addressing the challenges and opportunities in delivering such training.