Sample Preparation for Quantitative Analysis Under TEM

One of important aspect of material analysis i.e. quantitative analysis using transmission electron microscopy (TEM), has been exhaustively discussed in current chapter. Briefly highlighting the importance of quantitative and respective probable mode analysis has been discussed. Individual explanation of electron diffraction (ED), energy dispersive x-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), scanning transmission electron microscopy (STEM) modes of operation w.r.t. principle, working, unique characteristics, application and probable challenges have been discussed in detail. Through current chapter, researchers/scientist become able to expand and explain imaging aspect of specimen analysis in thorough and insightful way, through optimized sample preparation techniques.