Techniques for Thin Specimen from Bulk Samples

Ideal TEM imaging of specimen will be attained through precise electron transparent sample preparation. Importance of optimum specimen thickness during TEM imaging will revolve around optimum thickness, maximum contrast, stability and integrity of specimen. Whole approach during quality sample preparation will be guided through physical, chemical and functional properties of material/specimen under EM study. Simple to complex sample pre-thinning and fine thinning processing, will be proceed through specimen disc cutting (~ 3 mm size), electropolishing, ion milling, cross-sectioning, ultramicrotomy, chemical etching, replica, FIB etc., techniques. Optimization of challenges faced during TEM sample preparation will be attained through experience and practice w.r.t. uniform sample thickness, optimum beam exposure, specimen appropriate orientation and specimen size with ultrastructural imaging at lowest possible resolution.