Ideal TEM Imaging, Analysis and Troubleshooting Tricks

Current chapter comprised of basic requirements related to pre and post requisite installation of TEM including ideal imaging parameters with practical troubleshooting strategies. Chapter further, reinvestigated about the basic and advanced EM imaging operation w.r.t. quality imaging with optimization of key parameters. It includes EM standard operation, beam alignment, electromagnetic lenses astigmatism correction etc., has been summarized. Further, systematic troubleshooting for basic to advanced TEM operation has been performed w.r.t. sample artefacts, specimen-beam interaction-oriented contamination, grid handling etc. Further precise sample preparation through focus ion beam (FIB), ultramicrotomy, high pressure freezing, auto-staining, controlled grid drying procedure etc., also has been explained. Ultimately with the help of current chapter, we expect that any novice or experience electron microscopist become expert and capable in executing ideal imaging, insightful interpretation with maintaining electron-microscope for long life.