Throughout the thesis, multiple experimental tools are used to fabricate, characterize and measure electronic devices pertaining to the Josephson diode effect in certain van der Waals transition metal dichalcogenide (TMDC) systems. In this chapter, the working principles of the tools and the methods used extensively are explained in detail. Especially the dilution refrigerator setup, which I had the privilege to set up and work with on many exciting experiments. The device fabrication process includes mechanical exfoliation of the van der Waals crystals, defining the electrodes using electron-beam lithography and photolithography, deposition of the superconducting electrodes on top of the flakes and lifting off the residual resist. The device is then characterized using a scanning electron microscope to find the exact spacing between the electrodes and an atomic force microscope is used to measure the thickness of the flake and deposited electrodes. The electrical transport characterization that involves the bulk of the data presented in the thesis is then performed in a dilution refrigerator setup that is capable of reaching temperatures below \( 10 \,{\text{mK}}\) . Some basic electrical characterizations are performed in a Physical Property Measurement System (PPMS).

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Experimental Methods

  • Pranava Keerthi Sivakumar

摘要

Throughout the thesis, multiple experimental tools are used to fabricate, characterize and measure electronic devices pertaining to the Josephson diode effect in certain van der Waals transition metal dichalcogenide (TMDC) systems. In this chapter, the working principles of the tools and the methods used extensively are explained in detail. Especially the dilution refrigerator setup, which I had the privilege to set up and work with on many exciting experiments. The device fabrication process includes mechanical exfoliation of the van der Waals crystals, defining the electrodes using electron-beam lithography and photolithography, deposition of the superconducting electrodes on top of the flakes and lifting off the residual resist. The device is then characterized using a scanning electron microscope to find the exact spacing between the electrodes and an atomic force microscope is used to measure the thickness of the flake and deposited electrodes. The electrical transport characterization that involves the bulk of the data presented in the thesis is then performed in a dilution refrigerator setup that is capable of reaching temperatures below \( 10 \,{\text{mK}}\) . Some basic electrical characterizations are performed in a Physical Property Measurement System (PPMS).