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Although STEM has a long history (it was first demonstrated by von Ardenne in  ~1937), it is only since the 2000s that the scanning technology has been fully integrated into commercial TEM instruments to give levels of performance comparable to that achieved with what we used to call ‘dedicated’ machines.

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Imaging in the STEM

  • 章节

  • 发表日期：

    2026年

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  • Stephen J. Pennycook,
  • Timothy J. Pennycook

摘要

Although STEM has a long history (it was first demonstrated by von Ardenne in  ~1937), it is only since the 2000s that the scanning technology has been fully integrated into commercial TEM instruments to give levels of performance comparable to that achieved with what we used to call ‘dedicated’ machines.