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This chapter discusses strategies to improve the reliability of Physically Unclonable Functions (PUFs). It covers various approaches, including error correction codes, temporal majority voting, and selective response filtering, that enhance the reliability of PUFs under varying operating conditions. The chapter also examines the use of subthreshold CMOS technology to address reliability issues in delay-based PUFs. It provides an overview of recent innovations to make PUFs more resilient to environmental noise, aging, and other factors that can degrade reliability.

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Improving the PUF’s Reliability

  • 章节

  • 发表日期：

    2025年

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  • Kasem Khalil,
  • Haytham Idriss,
  • Tarek Idriss,
  • Magdy Bayoumi

摘要

This chapter discusses strategies to improve the reliability of Physically Unclonable Functions (PUFs). It covers various approaches, including error correction codes, temporal majority voting, and selective response filtering, that enhance the reliability of PUFs under varying operating conditions. The chapter also examines the use of subthreshold CMOS technology to address reliability issues in delay-based PUFs. It provides an overview of recent innovations to make PUFs more resilient to environmental noise, aging, and other factors that can degrade reliability.