Analysis of Photovoltaic Module Defects Based on Infrared Images
摘要
This study presents a new approach for detecting defects in photovoltaic modules by applying infrared images. It shows a high level of accuracy and efficiency over traditional manual inspections by employing advanced algorithms to identify issues like cracks, hot spots, short circuits, and scratches. The implementation of this technology promises significant improvements in the maintenance and performance of solar energy systems. It can localize the defects and their type which helps to calculate the total efficiency and predict the output power of the modules.