Analysis of Structural and Optical Features of Nanosized ZnO Films by Modulation Polarimetry Methods

The method of modulation polarimetry was used to study nanoscale films of zinc oxide obtained by deposition from a solution of zinc acetate followed by annealing. The use of the modulation polarimetry technique in the version of internal reflection, in particular, the Kretschmann geometry, made it possible to obtain information on the optical properties and structural features of the films under study. An analysis of the spectral and angular dependencies of the Stokes vector components confirms the presence of a cluster structure in ZnO films and resonant dipole interaction with an electromagnetic wave. As it turned out, in isolated dielectric clusters, the field is oriented along the normal to the cluster surface. The results obtained indicate the possibilities of using the studied nanosized ZnO films in various practical applications, in particular, in optical sensors.