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Device Fabrication and Measurement Set-Up

  • Saurabh Kumar Srivastav

摘要

This chapter will discuss the details of the device fabrication and measurement techniques. We will start our discussion with the mechanical exfoliation and characterization of atomically thin two-dimensional (2D) materials, like “graphene” and few-layer hexagonal boron nitride (hBN) flakes. Further, we will discuss the heterostructure assembly process. Later on, we will discuss the process used to make the electrical contacts. The second section of this chapter will discuss the measurement techniques and setup used in the electrical and thermal conductance measurement reported in this thesis.