Study of Spin Reorientation and Dielectric Phenomenon in \({\varvec{S}}{{\varvec{m}}}_{3-{\varvec{x}}}{\varvec{B}}{{\varvec{i}}}_{{\varvec{x}}}{\varvec{F}}{{\varvec{e}}}_{5}{{\varvec{O}}}_{12}({\varvec{x}}=0.0-0.6)\) Samples

This paper deals with the structural, magnetic and dielectric properties analysis for \(S{m}_{3-x}B{i}_{x}F{e}_{5}{O}_{12} (x=0.0-0.6)\) samples obtained from solid-state reaction method. The lattice parameter is obtained from the refined XRD data that comes out to be \(12.5391 (1)\) Å for \(x=0.0\) sample and it goes on increasing to the value of \(12.5528 \left(2\right)\) Å for \(x=0.6\) sample. The crystallite size also follows the same pattern and it has enhanced from \(111\,\, {\text{nm}}\) to \(196 \,\, {\text{nm}}\) for \(x=0.6\) sample. Further, the magnetic characterization encompasses the spin reorientation transition at around \(65 K\) which is almost independent of the doping concentration of \(Bi\) . Additionally, we have noticed a magnetic transition in the lower temperature region arising because of the ordering of rare earth ions. The saturation magnetization is dropped from \(32.46 \,\, {\text{emu/g}}\) to \(26.76 \,\, {\text{emu/g}}\) with the non-magnetic \(Bi\) substitution. Further, the dielectric constant is measured and it is obtained in the order of \({10}^{3}\) at \(100 \,\, {\text{Hz}}\) frequency for \(x=0.0\) sample and it falls sharply with the increase in frequency. Along with this, the parent sample holds magneto-electric coupling which is absent in rest of the samples. This multiferroicity leads to the applicability of these materials in microwave applications. Moreover, dielectric behaviour of our samples follows Universal Dielectric Response by having slope almost equal to \(-1\) in the lower frequency regime.