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This chapter presents a detailed study of dead time correction in single-photon avalanche diode Front-end front ends. Specifically, we present a novel count rate correction model. Using a perimeter-gated SPAD (pg-SPAD), we set Dark count rate (DCR) dark count rates and predetermined dead times in a Front-end front end under test in order to study the novel model’s efficacy. We found that the new model had a prediction error of about 2.1% compared to an 18.8% prediction error obtained from the standard count rate correction model typically used in the literature

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Dead Time Correction in Single-Photon Avalanche Diode Front Ends

  • 章节

  • 发表日期：

    2025年

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  • Marc Dandin,
  • Nicole McFarlane,
  • Md Sakibur Sajal,
  • Fahimeh Dehghandehnavi,
  • Babak Nouri

摘要

This chapter presents a detailed study of dead time correction in single-photon avalanche diode Front-end front ends. Specifically, we present a novel count rate correction model. Using a perimeter-gated SPAD (pg-SPAD), we set Dark count rate (DCR) dark count rates and predetermined dead times in a Front-end front end under test in order to study the novel model’s efficacy. We found that the new model had a prediction error of about 2.1% compared to an 18.8% prediction error obtained from the standard count rate correction model typically used in the literature