In Situ Imaging of Misorientation Changes During Tensile Loading in Single-Crystal Nickel-Based Superalloys by High-Resolution X-ray Diffraction Mapping

Recently, the method called high-resolution imaging of misorientationsMisorientation in single crystalsSingle crystal has demonstrated its usefulness in accurately determining the single crystalSingle crystal quality in superalloysSuperalloys. This was made possible by obtaining high-resolution angular measurements of misorientationMisorientation (arc-sec) and high-resolution imaging (µm) combined with a relatively large measurement area. The technique combines traditional X-ray diffractionX-ray diffraction topography with high-resolution diffraction and advanced data post-processingProcessing, including color coding and 3D projections of diffraction images. It was demonstrated that the mosaic structure of superalloysSuperalloys is highly complex and varies at both the micro and macro levels. In the present work, the advanced high-resolution X-ray diffraction method for imaging misorientationMisorientation and mosaicity in single-crystal superalloysSingle-crystal superalloys was used to observe structural changes during uniaxial tensile loading. This research utilized single-crystalSingle crystal flat tension samples from CMSX-4CMSX-4 superalloySuperalloys prepared from the casting produced at a 3 mm/min withdrawal rate. The results indicate that the crystallographic orientation changes are within a few degrees up to the rupture. The evolution of the plastic deformation region was directly observed on the samples by contrast blurring.