Ultrasonic Atomic Force Microscopies in Nanotribology
摘要
In this chapter ultrasonic atomic force microscopy (AFM) techniques are discussed, which are dynamic AFMs working in contact mode that combine the excitation and detection of ultrasonic vibrations. Ultrasonic AFMs are widely used for quantitative mechanical property measurements and for non-destructive subsurface imaging. Here, we concentrate on the applications of ultrasonic AFMs in nanotribology studies. We will first introduce the working principles of ultrasonic AFMs, and then describe their applications in measuring surface properties and friction. Finally, we will summarize the use of ultrasonic AFMs to study and induce friction reduction and wear elimination.