错误:搜索内容不能为空,请输入英文关键词
错误:关键词超出字数限制,请精简
高级检索

Ultrasonic Atomic Force Microscopies in Nanotribology

  • Chengfu Ma,
  • Walter Arnold

摘要

In this chapter ultrasonic atomic force microscopy (AFM) techniques are discussed, which are dynamic AFMs working in contact mode that combine the excitation and detection of ultrasonic vibrations. Ultrasonic AFMs are widely used for quantitative mechanical property measurements and for non-destructive subsurface imaging. Here, we concentrate on the applications of ultrasonic AFMs in nanotribology studies. We will first introduce the working principles of ultrasonic AFMs, and then describe their applications in measuring surface properties and friction. Finally, we will summarize the use of ultrasonic AFMs to study and induce friction reduction and wear elimination.