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Translucent Precision: Exploiting Enabling Information to Evaluate the Quality of Process Models

  • Harry Herbert Beyel,
  • Wil M. P. van der Aalst

摘要

An event log stores information about executed activities in a process. Conformance-checking techniques are used to measure the quality of a process model using an event log. Part of the investigated quality dimensions is precision. Precision puts the behavior of a log and a model in relation. There are event logs that also store information about enabled activities besides the actual executed activities. These event logs are called translucent event logs. A technique for measuring precision is escaping arcs. However, this technique does not consider information on enabled activities contained in a translucent event log. This paper provides a formal definition of how to compute a precision score by considering translucent information. We discuss our method using a translucent event log and four different models. Our translucent precision score conveys the underlying concept by considering more information.