ASIC Testing

This chapter briefly discusses the most common Application Specific Integrated design (ASIC) testing techniques such as functional, scan, boundary scan, parametric, current and very low voltage, Built-In-Self-Test (BIST), memory, and parallel module test. Today’s ASIC designs without Design-For-Test (DFT) can be very expensive and may not meet the high-reliability requirements. It should be recognized that all DFT techniques require design trade-offs such as area, design cycle time, or extraction processing steps.