X-Ray Fluorescence

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发表日期：

2024年

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M. H. Carpenter,
P. J. Karpius,
M. C. Miller,
S. J. Pattinson

摘要

X-Ray Fluorescence (XRF) analysis is a complementary technique to densitometry. Densitometry measures photons that are transmitted through the sample without interaction, whereas XRF measures the radiation produced by photons that interact within the sample. This chapter discusses the theory of XRF, the type of excitation sources, and attenuation correction methods. The chapter closes with a presentation of XRF applications and instrumentation.