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End-to-End Ultrametric Learning for Hierarchical Segmentation

  • Raphael Lapertot,
  • Giovanni Chierchia,
  • Benjamin Perret

摘要

Hierarchical image segmentation aims to capture the structure of objects of different sizes at different scales and helps to understand the scene. With the success of neural networks for image segmentation and the recent emergence of object and part segmentation datasets, the task of supervised learning of segmentation hierarchies naturally arises. In a previous work, we proposed a differentiable ultrametric layer that transforms any dissimilarity measure into an ultrametric distance equivalent to a hierarchical segmentation. In this paper, we study several loss functions for end-to-end learning of a neural network model predicting hierarchical segmentations. In particular, we propose a generalization of the Rand index for hierarchical segmentation and propose exact and approximate algorithms to compute it. We introduce new metrics to compare hierarchical segmentations, and we demonstrate the suitability of the proposed pipeline with several possible loss function combinations on a simulated hierarchical dataset.