错误:搜索内容不能为空,请输入英文关键词
错误:关键词超出字数限制,请精简
高级检索

Test Rig for MEMS Run-out Sensor

  • Maciej Zams,
  • Sergiusz Łuczak

摘要

A custom test rig for experimental studies of a novel axial run-out sensor, based on a low-g MEMS accelerometer, is presented. It enables to manually apply precise angular position of the tested sensor and features computer-controlled data acquisition. A custom mechanical unit makes it possible to preset a desired angular misalignment of the sensitive axis of the tested sensor with respect to the rotation axis. The misalignment simulates a twist of a rotating element that is to be monitored by means of the sensor. The related geometrical relationships are presented. The main metrological features of the test rig are evaluated and briefly discussed; its scope of application as well as the related limitations are considered. A prototype of the axial run-out sensor is briefly presented. Exemplary results of experimental study of the prototype sensor realized by means of the test rig are reported.