Advanced Data Analytical Techniques for Profile Monitoring

Nowadays advanced sensing technology enables high-resolution in-process data collection during manufacturing, known as profiles or functional data. These data facilitate in-process monitoring and anomaly detection, which have been extensively studied in recent years. Yet three main challenges are the most essential: (i) how to model complex correlation structures of high-dimensional profiles, i.e., cluster-correlated or sparse-correlated profiles, (ii) how to efficiently detect changes before the profile is complete, and (iii) how to characterize the between-stage correlation of multi-stage profiles. To address these three challenges, we accordingly develop three techniques for high-dimensional profile monitoring, in-profile monitoring, and multi-stage profile monitoring.