Correlation of Nanostructural Features with Phase Transition in Thermochromic VO2 Thin Films for Smart Windows Applications
摘要
The nanostructural features of VO2 thin films, grown on either LSAT (La0.18Sr0.82)(Al0.59Ta0.41)O3, Si or Quartz substrates have been investigated by transmission electron microscopy (TEM/HRTEM) methods. The overall morphology, film thickness, roughness, VO2 phases and relative percentage, as well as residual strains have been elucidated. The electrical and magnetic characterisation complemented the TEM observations, where a smooth transition of metal to insulator (MIT) has been observed, mainly dependent on the relative percentage of the VO2 polymorphs. The effect of the residual strain has been also discussed, in relation to the MIT effectiveness.