On Geometric Estimates for Some Problems Arising from Modeling Pull-in Voltage in MEMS
摘要
In this paper, we prove that the pull-in voltage of the multidimensional MEMS (micro-electro mechanical systems) problem on the whole space \(\mathbb R^{d}, d\geq 3,\) is minimized by symmetrizing the permittivity profile. The proof relies on Talenti’s comparison principle.