AFM Electronics and Signal Processing
摘要
High-performance electronics and advanced signal processing algorithms are crucial for optimal atomic force microscope (AFM) imaging. These elements work together to support the operation of nano-positioning systems and cantilever probes, ultimately enabling the production of images with sub-nanometer resolution. In this chapter, the principles of high-bandwidth power amplifiers, signal conditioning electronics, and data acquisition systems are covered, primarily focusing on their role in the operation of nano-positioners.