Nanostructure Characterization Methods

This chapter provides the description of advanced techniques for nanostructure characterization, such as high energy synchrotron X-ray diffraction (SYXRD), small angle neutron scattering (SANS), atom probe tomography (APT), and high-resolution transmission electron microscopy (HRTEM). The fundamentals and development history of these material characterization methods are introduced. Besides, the experimental setups and sample preparation procedures are further addressed.