错误:搜索内容不能为空,请输入英文关键词
错误:关键词超出字数限制,请精简
高级检索

Multispectral Non-invasive Inspection of Marqueteries Coupled with Finite Element Analyses

  • Yinuo Ding,
  • Hai Zhang,
  • Stefano Sfarra,
  • Elena Pivarčiová,
  • Xavier P. V. Maldague

摘要

This work utilizes infrared and terahertz non-invasive imaging techniques to conduct a multispectral inspection of two marqueteries. Specifically, a flat sample with artificial defects and a curved sample without flaws are used. To cross-reference with the experimental results, a finite element simulation was carried out. Finally, two different experimental analyses and processing methods are compared, and their advantages and disadvantages are summarized.