Conclusion

This book investigates and elaborates upon the research activities conducted during this study. The primary goals were to research and analyze the vulnerabilities of mixed-signal circuits (such as clock generators, data converters, etc.) concerning ionizing radiation and to develop new architectures utilizing various techniques which harden mixed-signal circuits against radiation. TID effects are the outcome of prolonged exposure to ionizing radiation. These effects cause a gradual decline in the performance of semiconductor devices. When a charged particle hits a sensitive circuit node, it can cause SEEs, which are brief disruptions produced by the accumulation of charge in semiconductor materials. In most circumstances, the resulting voltage or current transients are not destructive in nature. However, in a small number of instances, when the transients are strong, they can contribute to destructive phenomena like SEL and SEGR. The research was conducted with the end goal of finding practical applications in a variety of harsh radiation environments. Some examples of these environments include high-energy physics experiments, critical long-term space missions, and future nuclear-powered plants. The findings of the research, as discussed in this book, offer a comprehensive overview of the effects of radiation on various circuits and offer directions on how to make circuits more resistant to ionizing radiation.