Grid-Index-Based Three-Dimensional Profilometry

Grid-index-based three-dimensional (3D) surface profilometry is a technique based on a spatially encoded structured light system (SLS). The competitive advantage of this technique is the ability to measure 3D surfaces in a single shot and is hence useful for real-time applications. This chapter will briefly review the existing fast, single-shot 3D measurement methods based on the grid-index-based structured light spatial projection. However, covering all possible 3D grid-index-based surface imaging techniques might be impossible. We have selected and explained essential methods to help readers gain insight into grid-index-based surface profilometry.