Shocks, Scans, and Reliability Systems

This chapter summarizes the close connection between one of the widely studied shock models known as δ-shock model and runs/scans. Under discrete time setting, i.e., when the shocks occur according to a binomial process, the linkage between the lifetime of the system under the shock model and the waiting time for the first scan is presented. Such a useful connection may create a new perspective to study the reliability properties of the system under the δ-shock model.