Structured Illumination Microscopy
摘要
Structured illumination microscopy (SIM) is a super-resolution technique that uses patterned excitation light to achieve an optical resolution that is twice the diffraction limit. It does not require special buffers or dyes. In this chapter, we discuss the implementation of structured illumination in fluorescence microscopy, show how to perform SIM acquisition and processing, and discuss typical SIM acquisition and processing artefacts and how to address them.