Electron Microscopy of Cryptococcus neoformans: Processing Challenges to Avoid Artifacts
摘要
This chapter describes methodological details for preparing specimens of Cryptococcus neoformans (although it can be applied to any species of the genus) and their subsequent analysis by scanning and transmission electron microscopyTransmission electron microscopy (TEM). Adaptations to conventional protocols for better preservation of the sample, as well as to avoid artifacts, are presented. The protocols may be used to examine both the surface ultrastructure and the interior of this pathogenic fungusFungi in detail.