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<p>An Erratum to this paper has been published: https://doi.org/10.3103/S1068371225100013</p>

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Erratum to: Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads

  • 期刊论文

  • 发表日期：

    2025年10月1日

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  • V. Ya. Khorolsky,
  • A. M. Isupova,
  • K. M. Yundin,
  • I. K. Sharipov

摘要

An Erratum to this paper has been published: https://doi.org/10.3103/S1068371225100013