Controlled Etching of Diamond via Carbothermal Reduction
摘要
This study investigated the carbothermal reduction etching behavior of the Fe2O3–C system on diamond (100) and (111) crystal planes at 1000°C. The results indicate that Fe and FeO, generated from the reduction of Fe2O3 by carbon, serve as the primary active agents for etching. However, significant differences in the etching mechanisms were observed between the two crystal planes. On the (111) plane, step-preferred etching led to the formation of triangular pyramidal pits, with the extent of etching diminishing as the carbon content increased. In contrast, the (100) plane exhibited square-shaped etch pits, and higher carbon content promoted deeper etching. This research elucidates the regulatory mechanism of anisotropic etching and raw material composition on etch morphology, providing a theoretical foundation for controlled etching processing of diamond.