错误:搜索内容不能为空,请输入英文关键词
错误:关键词超出字数限制,请精简
高级检索

Algorithm for Processing Microphotographs of Thin Sections during Scanning Electron Microscopy

  • M. Kh. Kadim,
  • N. A. Khristyuk,
  • L. A. Rusinov

摘要

Abstract

The performance characteristics of products—wear resistance, corrosion resistance, resistance to radiation damage, etc.—are largely determined by the type and quality of coatings. When applying coatings using diffusion methods, their quality is controlled by electron microscopy of transverse sections. An algorithm for processing microphotographs of thin sections is proposed, which allows one to visualize the nature and determine the parameters of the diffusion zone. The algorithm was tested on microphotographs of thin sections on coatings of an iron core with chromium and titanium.