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Abstract <p>This study explores the potential for controlled surface topography modification of additively manufactured Ti6Al4V and AlSi10Mg alloys through 10 keV argon gas cluster ion irradiation. The effect of the ion incidence angle on the resulting surface morphology is examined. Under normal incidence, cluster ion irradiation reduces surface roughness from 6.2 to 0.89 nm for Ti6Al4V and from 16.8 to 4.27 nm for AlSi10Mg (as measured by atomic force microscopy over a <InlineEquation ID="IEq1"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="11972_2025_8833_Article_IEq1.gif" Format="GIF" Height="14" Rendition="HTML" Resolution="72" Type="Linedraw" Width="39" /> </InlineMediaObject> <EquationSource Format="TEX">\(3\times 3\)</EquationSource> <!--BPhysMGU2570084Kireev-m1--> </InlineEquation> <InlineEquation ID="IEq2"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="11972_2025_8833_Article_IEq2.gif" Format="GIF" Height="12" Rendition="HTML" Resolution="72" Type="Linedraw" Width="15" /> </InlineMediaObject> <EquationSource Format="TEX">\(\mu\)</EquationSource> <!--BPhysMGU2570084Kireev-m2--> </InlineEquation>m<InlineEquation ID="IEq3"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="11972_2025_8833_Article_IEq3.gif" Format="GIF" Height="10" Rendition="HTML" Resolution="72" Type="Linedraw" Width="8" /> </InlineMediaObject> <EquationSource Format="TEX">\({}^{2}\)</EquationSource> <!--BPhysMGU2570084Kireev-m3--> </InlineEquation> scan area). The spatial wavelength range where significant surface smoothing occurs is identified. Oblique incidence irradiation induces uniform formation of an ordered ripple pattern, independent of crystallographic orientation and material phase.</p>

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Surface Topography Modification of Additive Manufactured Ti6Al4V and AlSi10Mg Alloys under Argon Cluster Ion Irradiation

  • 期刊论文

  • 发表日期：

    2025年8月1日

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  • D. S. Kireev,
  • D. R. Bessmertnyi,
  • V. S. Chernysh,
  • A. E. Ieshkin

摘要

Abstract

This study explores the potential for controlled surface topography modification of additively manufactured Ti6Al4V and AlSi10Mg alloys through 10 keV argon gas cluster ion irradiation. The effect of the ion incidence angle on the resulting surface morphology is examined. Under normal incidence, cluster ion irradiation reduces surface roughness from 6.2 to 0.89 nm for Ti6Al4V and from 16.8 to 4.27 nm for AlSi10Mg (as measured by atomic force microscopy over a \(3\times 3\) \(\mu\) m \({}^{2}\) scan area). The spatial wavelength range where significant surface smoothing occurs is identified. Oblique incidence irradiation induces uniform formation of an ordered ripple pattern, independent of crystallographic orientation and material phase.