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Abstract <p>A method is proposed for estimating the effect of small losses in the layers of periodic two-component antireflection structures with wave-coupled thicknesses in the period (<InlineEquation ID="IEq1"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="11972_2025_8809_Article_IEq1.gif" Format="GIF" Height="10" Rendition="HTML" Resolution="72" Type="Linedraw" Width="13" /> </InlineMediaObject> <EquationSource Format="TEX">\(\pi\)</EquationSource> <!--BPhysMGU2570065Zhitelev-m1--> </InlineEquation>-structures) on their optical characteristics using simple analytical ratios. The applicability of the proposed method is demonstrated for various refractive indices of the antireflected media, absorption coefficients of the layer materials, and numbers of layers. The correctness of the obtained results is confirmed by numerical experiment.</p>

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Analytical Method for Estimating the Effect of Small Losses in the Layers of Periodic Two-Component Antireflection Structures with Wave-Coupled Layer Thicknesses in the Period on Their Optical Characteristics

  • 期刊论文

  • 发表日期：

    2025年6月1日

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  • A. E. Zhitelev,
  • A. V. Kozar

摘要

Abstract

A method is proposed for estimating the effect of small losses in the layers of periodic two-component antireflection structures with wave-coupled thicknesses in the period ( \(\pi\) -structures) on their optical characteristics using simple analytical ratios. The applicability of the proposed method is demonstrated for various refractive indices of the antireflected media, absorption coefficients of the layer materials, and numbers of layers. The correctness of the obtained results is confirmed by numerical experiment.