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<p>Surface enhanced raman spectroscopy (SERS) has attracted considerable attention because it enables detection of target molecules at very low concentrations. In most studies, sampling involves measuring only a few randomly selected sites, which can be insufficient for accurate characterization. Drop cast SERS systems are particularly vulnerable to this limitation because they often display coffee-ring-like analyte distributions. In this work, we used a drop cast SERS system exhibiting the coffee ring effect and measured a full spatial map of the dried droplet. This map served as a reference for evaluating three sampling strategies: random, spiral, and x-cross sampling. Among these, the x-cross method provided the most accurate results, with relative errors below 10%, while limited random sampling resulted in errors near 80%. These findings suggest that x-cross sampling offers a practical and reliable approach for analyzing SERS substrates with uneven radial distributions.</p> Graphical Abstract <p></p>

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MetroSERS–Part I: Towards a statistically robust sampling method for characterizing the surface-enhanced Raman signal in systems with coffee ring effect

  • 期刊论文

  • 发表日期：

    2025年12月15日

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  • Felipe Orozco,
  • Paola Fuentes-Schweizer,
  • Omar M. Villalta-Hernandez,
  • Sergio A. Paniagua

摘要

Surface enhanced raman spectroscopy (SERS) has attracted considerable attention because it enables detection of target molecules at very low concentrations. In most studies, sampling involves measuring only a few randomly selected sites, which can be insufficient for accurate characterization. Drop cast SERS systems are particularly vulnerable to this limitation because they often display coffee-ring-like analyte distributions. In this work, we used a drop cast SERS system exhibiting the coffee ring effect and measured a full spatial map of the dried droplet. This map served as a reference for evaluating three sampling strategies: random, spiral, and x-cross sampling. Among these, the x-cross method provided the most accurate results, with relative errors below 10%, while limited random sampling resulted in errors near 80%. These findings suggest that x-cross sampling offers a practical and reliable approach for analyzing SERS substrates with uneven radial distributions.

Graphical Abstract