Water dissociation on graphene/Ir(111) studied by temperature-dependent X-ray photoelectron spectroscopy
摘要
Water dissociation induced by graphene has been investigated by using temperature-dependent X-ray photoelectron spectroscopy (XPS) from 120 K to room temperature. Comparative studies on the interaction of water with the bare Ir(111) surface and submonolayer graphene/Ir(111) surface have observed graphene-induced spontaneous water dissociation above 160 K. The dominant role of graphene defects in the observed water dissociation has been corroborated by performing water exposure and XPS measurements of three different graphene/Ir(111) surfaces with different coverage and/or structural quality of the graphene layer. Our studies provide new relevant experimental insights into graphene-induced spontaneous water dissociation, which is valuable for understanding water-graphene interactions toward practical applications of graphene.
Graphical abstract