Effects of melting zone height on crystallization quality and photoelectric properties of GaInSb crystals grown with traveling heater method
摘要
GaxIn1-xSb (0 < x < 1) single crystals have broad application prospects due to their excellent physical properties. Ga0.9In0.1Sb crystals (Φ27 × 110 mm) were prepared with the traveling heater method (THM) with a GaSb seed crystal. The effects of the melting zone height on the crystal structure and photoelectric properties of the GaInSb crystal were investigated. The ingot grown at the melting zone height of 35 mm exhibited the best crystallization quality, and both the dislocation density and the radial segregation first decreased and then increased with the melting zone height increase, reaching the minimal values of 1.509 × 103 cm⁻2 and 0.032 mol%/mm, respectively. Similarly, the carrier concentration, the carrier mobility, and the infrared transmittance all initially increased and subsequently decreased, reaching the maximum values of 1.571 × 1018 cm⁻3, 1714 cm2/(V·s), and 55%, respectively, at 35 mm melting zone height. However, the minimal axial segregation (0.034 mol%/mm) was obtained at 18 mm.
Graphical abstract