Abstract <p>The results of a study of the microstructure, elemental and phase compositions of a eutectic alloy Al–12.5 wt % Si–0.8 wt % Mg–0.4 wt % Mn–0.7 wt % Fe–0.9 wt % Ni–1.8 wt % Cu after Isochronal annealing for 1 h at 300, 400 and 500°C are presented. It is shown that annealing at 300°C does not lead to significant changes in the microstructure and phase composition of the foil. Increasing the annealing temperature to 400 and 500°C causes coarsening of the nanosized globular Si inclusions, as well as fragmentation of thin silicon plates and their spheroidization. Using X-ray spectral microanalysis and X-ray diffraction analysis, the decomposition of the Al<sub>3</sub>(NiCu)<sub>2</sub> compound and the formation of intermetallics Mg<sub>5</sub>Si<sub>6</sub>, Al<sub>17</sub>(NiFeMn)Si<sub>2</sub> and Al<sub>3</sub>Cu<sub>2</sub> at 500°C were established. The diffusion mechanisms leading to the change in phase composition are discussed.</p>

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Thermal Stability of the Microstructure of Rapidly Solidified Eutectic Al–Si Alloy Alloyed with Metals

  • V. G. Shepelevich,
  • O. V. Gusakova,
  • S. V. Husakova

摘要

Abstract

The results of a study of the microstructure, elemental and phase compositions of a eutectic alloy Al–12.5 wt % Si–0.8 wt % Mg–0.4 wt % Mn–0.7 wt % Fe–0.9 wt % Ni–1.8 wt % Cu after Isochronal annealing for 1 h at 300, 400 and 500°C are presented. It is shown that annealing at 300°C does not lead to significant changes in the microstructure and phase composition of the foil. Increasing the annealing temperature to 400 and 500°C causes coarsening of the nanosized globular Si inclusions, as well as fragmentation of thin silicon plates and their spheroidization. Using X-ray spectral microanalysis and X-ray diffraction analysis, the decomposition of the Al3(NiCu)2 compound and the formation of intermetallics Mg5Si6, Al17(NiFeMn)Si2 and Al3Cu2 at 500°C were established. The diffusion mechanisms leading to the change in phase composition are discussed.