A Method for Optimal Value Measurement
of Some Parameters of Fault Attacks
on Cryptographic Algorithms
摘要
Abstract
This paper is devoted to the construction of a time-optimal method for measuring themaximum permissible (critical) value of the supply voltage (as well as other parameters) of thedevice on which the cryptographic algorithm is performed. Knowledge of these values is necessaryfor successful conduct of error injection, as part of a fault attack. The method is based ondynamic programming.