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Abstract <p>In the context of modern accelerator technology, it is essential to guarantee the specified characteristics of the extracted electron beam. In addition to the information regarding the energy and intensity of the beam, it is crucial to ascertain its spatial and angular distribution. This paper introduces the first step towards realization of a multi-angle scanning method for 2D electron beam profile reconstruction.</p>

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Development and Calibration of the Multi-Detector System for Multi-Angle Scanning Method to Measure 2D Electron Beam Profile

  • 期刊论文

  • 发表日期：

    2025年10月3日

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  • E. Bushmina,
  • S. Alexeev,
  • A. Baldin,
  • A. Bulavskaya,
  • P. Karataev,
  • A. Krylov,
  • S. Mitrofanov,
  • I. Miloichikova,
  • V. Semin,
  • K. Timoshenko,
  • S. Stuchebrov

摘要

Abstract

In the context of modern accelerator technology, it is essential to guarantee the specified characteristics of the extracted electron beam. In addition to the information regarding the energy and intensity of the beam, it is crucial to ascertain its spatial and angular distribution. This paper introduces the first step towards realization of a multi-angle scanning method for 2D electron beam profile reconstruction.