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Abstract <p>X-ray diffraction and optical microscopy investigations of the structural and morphological properties of polycrystalline perovskite CsPbBr<sub>3</sub> thin films deposited by vacuum thermal evaporation were conducted. The effect of the thermal annealing regime of the deposited films on their phase composition, microstructure, morphology and degree of crystallographic texturing was studied. The character of the correlation between the average sizes of grains and crystallites (subgrains) and the degree of crystallites` texturing with change of the annealing regime of films was analyzed.</p>

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Investigations of the Structure and Morphology of CsPbBr3 Films Deposited by Vacuum Thermal Evaporation

  • 期刊论文

  • 发表日期：

    2025年6月1日

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  • L. A. Matevosyan,
  • S. A. Petrosyan,
  • V. P. Mkrtchyan,
  • A. P. Aivazyan,
  • V. S. Harutyunyan

摘要

Abstract

X-ray diffraction and optical microscopy investigations of the structural and morphological properties of polycrystalline perovskite CsPbBr3 thin films deposited by vacuum thermal evaporation were conducted. The effect of the thermal annealing regime of the deposited films on their phase composition, microstructure, morphology and degree of crystallographic texturing was studied. The character of the correlation between the average sizes of grains and crystallites (subgrains) and the degree of crystallites` texturing with change of the annealing regime of films was analyzed.