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Wavefront Lens Corrector for Studying Flat Surfaces

  • M. N. Toropov,
  • A. A. Akhsakhalyan,
  • I. V. Malyshev,
  • M. S. Mikhaylenko,
  • A. E. Pestov,
  • N. N. Salaschenko,
  • A. K. Chernyshov,
  • N. I. Chkhalo

摘要

Abstract

The method of manufacturing and the results of studies of a lens corrector that converts a spherical diverging front into a plane one and is intended for studying flat surfaces as part of an interferometer with a diffraction comparison wave is described. A feature of the corrector is the use of an aspherical convex surface with a maximum deviation of ~200 μm from the nearest sphere. The first experimental results are presented, indicating the prospects for using ion-beam processing to improve the quality of the wavefront. After the procedure of ion-beam processing, the aberrations over the entire aperture of the corrector decreased by more than 4 times and amounted to the parameter of the height difference PV = 207 nm (~λ/3) and (RMS) = 19.2 nm (~λ/33). On an area with a diameter of 80%, the aberrations fell to the nanometer level: PV = 65 nm (~λ/10) and RMS = 8.3 nm (~λ/76).